Popular Case Studies of Various VLSI Test Scan Architectures

Madhura.R, Ravi Shankar J, Dr. Shanthi Prasad .M.J.1

1

Publication Date: 2019/01/26

Abstract: In today’s world, good testing leads to better quality products and total customer satisfaction. This technical survey paper summarizes various important research works in low power VLSI test scan architecture.

Keywords: Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.

DOI: No DOI Available

PDF: https://ijirst.demo4.arinfotech.co/https://ijisrt.com/wp-content/uploads/2018/04/Popular-case-studies-of-various-VLSI-Test-Scan-architectures.pdf

REFERENCES

No References Available